Saturday
Oct232010
Scanning Electron Microscope (SEM)
Saturday, October 23, 2010 at 12:16AM 
Oceanit has a state-of-the-art Hitachi scanning electron microscope (SEM) with 800,000 times magnification (2 to 3 nm resolution) equipped with an x-ray energy dispersive spectrometer, useful for imaging nanosized features and characterizing the elemental makeup of a sample.


